Nanometrics Incorporated is engaged in the design, manufacture, and marketing of process control metrology systems used in the manufacture of silicon and compound semiconductor substrates, devices and integrated circuits. The Company's metrology systems measure various optical and physical thin film properties, critical circuit dimensions and layer-to-layer circuit alignment (overlay). Its measurement systems use microscope-based, non-contact spectroscopic reflectometry (SR). Some of its systems provide spectroscopic ellipsometry (SE) and fourier-transform infra-red (FTIR) to measure the thickness and optical characteristics of films on a variety of substrates. In addition, it offers both integrated and standalone optical critical metrology systems to measure critical dimensions of patterns on semiconductor wafers. Its products are divided into two groups: standalone systems and integrated systems. In May 2008, the Company acquired Tevet Process Control Technologies, Ltd.